Centre des Publications Scientifiques |
Electrical characterisation of thin silicon layers by light beam induced current and internal quantum efficiency measurementshttps://www.univ-soukahras.dz/fr/publication/article/496 |
Yassine Sayad, S. Amtablian, A. Kaminski and D. Blanc (2009) Electrical characterisation of thin silicon layers by light beam induced current and internal quantum efficiency measurements. Materials Science and Engineering B , 165(1-2), 67-70, Elsevier |
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