Yassine Sayad, S. Amtablian, A. Kaminski and D. Blanc (2009) Electrical characterisation of thin silicon layers by light beam induced current and internal quantum efficiency measurements. Materials Science and Engineering B , 165(1-2), 67-70, Elsevier
المنشورات العلمية
هام: هذه الصفحة مجمدة. الوثائق الحديثة متوفرة الآن في المستودع الرقمي DSpace
ملخص المقال
معلومات
| Item Type | Journal |
|---|---|
| Divisions |
» كلية العلوم و التكنولوجيا |
| ePrint ID | 496 |
| Date Deposited | 2016-02-05 |
| Further Information | Google Scholar |
| URI | https://univ-soukahras.dz/ar/publication/article/496 |
BibTex
@article{uniusa496,
title={Electrical characterisation of thin silicon layers by light beam induced current and internal quantum efficiency measurements},
author={Yassine Sayad, S. Amtablian, A. Kaminski and D. Blanc},
journal={Materials Science and Engineering B}
year={2009},
volume={165},
number={1-2},
pages={67-70},
publisher={Elsevier}
}
title={Electrical characterisation of thin silicon layers by light beam induced current and internal quantum efficiency measurements},
author={Yassine Sayad, S. Amtablian, A. Kaminski and D. Blanc},
journal={Materials Science and Engineering B}
year={2009},
volume={165},
number={1-2},
pages={67-70},
publisher={Elsevier}
}