Abstract

Recently, independent research groups have developed camera based techniques to evaluate local silicon solar cells parameters. Among these techniques, Dark Lock-In Thermography DLIT is, conventionally, used to evaluate shunts and minority carrier lifetime, but, since few years DLIT is becoming a versatile technique capable to do full solar cell characterisation.
Here, we apply a DLIT based method to evaluate solar cell local dark parameters. The method is completed by external evaluation of local series resistance from two electroluminescence images taken under different conditions.

Information

Item Type:	Conference
Divisions:	» Faculty of Science and Technology
ePrint ID:	555
Date Deposited:	2016-06-23
Further Information:	Google Scholar
URI:	https://www.univ-soukahras.dz/en/publication/article/555

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